Statistical method for 2D material synthesis
Scheduled talk time: 29th of November, Room 308, Building 910.
2D material possess interesting physical properties, and synthesis of 2D materials are one of the key material research topics. However, for the industrial synthesis of these 2D material, optimization of the synthesis through the identification of the key process parameters (also known as factors) must be identified. One-factor-at-a-time (OFAT) experimentation is the most common method to identify the key factors, in which only one factor or variable is varied at a time while keeping others fixed, but it suffers several limitations as will be discussed in this talk. The technique of Design-of-Experiments (DoE) is a Statistical wonder which enables efficient design of any process with respect to rational choice of key parameters. In this talk, the applications of DoE to Graphene growth or synthesis process as performed by my team will be presented.
In this talk, I will highlight the prevalence of DoE technique in industrial processes and importance of DoE technique, and I will enunciate the need for DoE from the materials’ science point of view. Application of various concepts such as Attribute Response Design, Full Factorial DoE, and Filtered DoE approach to the novel Graphene Synthesis method will be discussed and explained briefly. This Filtered DoE is a modified DoE method developed by my team.
Dr. Tan is a Singaporean, and he received his Ph.D in Electrical Engineering from the University of Toronto in 1992. He has 10 years of working experiences in reliability in electronic industry before joining Nanyang Technological University (NTU), Singapore as faculty member in 1996 till 2014. He joined Chang Gung University, Taiwan and set up a research Center on Reliability Sciences and Technologies in Taiwan and acts as Center Director. He is Professor in Electronic Department of Chang Gung University, Honorary Chair Professor in Ming Chi University of Technology, Taiwan, Adjunct Professor in the College of Medicine, and Researcher in the Chang Gung Memorial Hospital, Linkou. He has published 300+ International Journal and Conference papers, and giving 10+ keynote talks and 50+ invited talks in International Conferences and several tutorials in International Conferences. He holds 14 patents and 1 copyright on reliability software. He has written 4 books and 3 book chapters in the field of reliability. He is an Editor of Scientific Report, Nature Publishing Group, an Editor of IEEE TDMR, Series Editor of SpringerBrief in Reliability, and Associate editor of Microelectronic Reliability. He is a member of the advisory panel of Elsevier Publishing Group.
He is a past chair of IEEE Singapore Section in 2006, senior member of IEEE and ASQ, Distinguish Lecturer of IEEE Electronic Device Society on reliability, Founding Chair and current Chair of IEEE Nanotechnology Chapter - Singapore Section, Fellow of Institute of Engineers, Singapore, and Fellow of Singapore Quality Institute. He is the Founding Chair of IEEE International Conference on Nanoelectronics, General Chair of ANQ Congress 2014. He is a recipient of IEEE Region 10 Outstanding Volunteer Award in 2011. He was Guest Editor of International J. of Nanotechnology, Nano-research letter and Microelectronic Reliability. He is in the reviewer board of several International Journals such as Thin Solid Film, Microelectronic Reliability, various IEEE Transactions, Reliability Engineering and System Safety etc. He is the first individual recipient of Ishikawa-Kano Quality Award in Singapore in 2014. He is active in providing consultation to multi-national corporations on reliability.
His research interests include reliability and failure physics modeling of electronic components and systems, finite element modeling of materials degradation, statistical modeling of engineering systems, nano-materials and devices reliability, and prognosis & health management of engineering system.
For more detail, please visit www.chermingtan.com